Silicon Germanium (SiGe) Substrates in Stock - University Wafer
Tensile-strained Ge/SiGe quantum-well photodetectors on silicon substrates with extended infrared response
Wafer-Scale Integration of Graphene-Based Photonic Devices | ACS Nano
Schematic cross section of SiGe HBT on wafer-bonded SOI with buried... | Download Scientific Diagram
Process Integration - Coventor
A schematic cross-section of the SiGe BiCMOS SBC18H3 process where the... | Download Scientific Diagram
Strained Si, SiGe, and Ge on-insulator: review of wafer bonding fabrication techniques - ScienceDirect
Process Integration - Coventor
The sample production visualized in wafer cross section. (a) The top... | Download Scientific Diagram
Figure 5 from Development of a Through-Silicon Via (TSV) Process Module for Multi-project Wafer SiGe BiCMOS and Silicon Interposer | Semantic Scholar
Figure 3 from Development of a Through-Silicon Via (TSV) Process Module for Multi-project Wafer SiGe BiCMOS and Silicon Interposer | Semantic Scholar
Scheme of the cross-section of a planarized BiCMOS chip ready for the... | Download Scientific Diagram
Next Generation Device Grade Silicon-Germanium on Insulator | Scientific Reports
Schematic cross-section of the UHV/CVD SiGe HBT. | Download Scientific Diagram
IMEC Offers SiGe-MEMS Foundry Service
Towards large size substrates for III-V co-integration made by direct wafer bonding on Si: APL Materials: Vol 2, No 8
Epitaxial growth of SiGe films by annealing Al–Ge alloyed pastes on Si substrate | Scientific Reports
Advanced Epi - Group IV Epitaxy Services - SiGe Epitaxy
Figure 2 from Development of a Through-Silicon Via (TSV) Process Module for Multi-project Wafer SiGe BiCMOS and Silicon Interposer | Semantic Scholar
Philips Semiconductors - Newsroom; Backgrounders;
Advanced Epi - Group IV Epitaxy Services - Germanium
Strained Si, SiGe, and Ge on-insulator: review of wafer bonding fabrication techniques - ScienceDirect
Applied Sciences | Free Full-Text | Experimental Analyses on Multiscale Structural and Mechanical Properties of ε-Si/GeSi/C-Si Materials
Comparison of cross‐sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers - NORRIS - 2017 - Journal of Microscopy - Wiley Online Library
X-FAB: News
A Trip Down TSMC Memory Lane – Part 2 | TechInsights
